LF357 DATASHEET PDF

LF JFET Input Operational Amplifiers. These are the first monolithic JFET input operational amplifiers to incorporate well matched, high voltage JFETs on the. LF datasheet, LF circuit, LF data sheet: STMICROELECTRONICS – WIDE BANDWIDTH SINGLE J-FET OPERATIONAL AMPLIFIERS,alldatasheet. LF datasheet, LF circuit, LF data sheet: TI – LF/LF/LF/ LF/LF/LF/LF JFET Input Operational Amplifiers,alldatasheet.

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Unless otherwise specified the absolute maximum negative input voltage is equal to the negative power supply voltage.

Gain Bandwidth Figure Therefore large differential input voltages can easily be accommodated without a large increase in input current. TI has discontinued the production of the device. Pin Configuration and Functions Important Information and Disclaimer: Created to foster collaboration among engineers. If a guard ring is used and held close to the potential of the amplifier inputs, it will significantly reduce datashfet leakage current.

Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause harm and take appropriate remedial actions. Where designed to be soldered at high temperatures, TI Pb-Free dqtasheet are suitable for use in specified lead-free processes. Customers should validate and test their design implementation to confirm system functionality.

Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support that may be provided by TI.

In neither case does a latch occur since raising the input back within the common-mode range again puts the input stage and thus the amplifier in a normal operating mode. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

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LF Datasheet(PDF) – STMicroelectronics

This component has a RoHS exemption for either 1 lead-based flip-chip solder bumps used between the die and package, or 2 lead-based die adhesive used between the die and leadframe. Use an oscilloscope to probe the circuit as shown in Figure In normal operation the junction temperature rises above the ambient temperature as a result of internal power dissipation, Pd. Common-Mode Rejection Ratio Figure Settling Time Test Circuit 8.

Information published by TI regarding third-party products or services does not constitute a license to use such products or services or a xatasheet or endorsement thereof. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Products Applications Audio www. The information provided on this page represents TI’s knowledge and belief as of the date that it is provided.

Linked contents are provided “AS IS” by the respective contributors. Samples may or may not be available. Ld357 fact, the common-mode voltage can exceed the positive supply by approximately mV independent of supply voltage and over the full operating temperature range.

Except where mandated by applicable law, testing of all parameters of each component is not necessarily performed. Common-mode rejection dtaasheet open-loop voltage gain are also unaffected by offset adjustment. However, neither of the input voltages should be allowed to exceed the negative supply as this will cause large currents to flow which can result in a destroyed unit. To minimize the effect of any surface leakage, lf537 out a ring of foil completely surrounding the inputs of the LFx5x and the terminals of capacitors, diodes, conductors, resistors, datawheet terminals, and so forth, connected to the inputs of the op amp, as in Figure Use of a heat sink is recommended if input bias current is to be kept to a minimum.

Exceeding the negative datasheft limit on either input will force the output to a high state, potentially causing a reversal of phase to the output. In particular, use FET to isolate the probe capacitance. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty.

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LF357 Datasheet PDF – National Semiconductor

Input pins are lifted out of PCB and soldered directly to components. Buyer will fully indemnify TI and its representatives against any damages arising out of the use of any TI components in safety-critical applications.

Exceeding the positive common-mode limit on a single input will not change the phase of the output however, if both inputs exceed the limit, the output of the amplifier will be forced to a high state.

TI is not responsible or liable for any such statements. Positive Current Limit Figure 9.

TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.

Bode Plot Figure Due to limited production test time, the input bias currents measured are correlated to junction temperature. We recommend that datasueet same precautions be adhered to, during all phases of datasheeet, test and assembly. To have a significant effect, guard rings must be placed on both the top and bottom of the PCB.

No TI components are authorized for use in FDA Class III or similar life-critical medical equipment unless authorized officers of the parties have executed a special agreement specifically governing such use.

Information of third parties may be subject to additional restrictions. Voltage Swing Figure 5. In many instances the frequency of this pole is much greater than the expected 3-dB frequency of the closed loop gain and consequently there is negligible effect on stability margin.

Output Impedance Figure The parallel resistance and capacitance from the input of the device usually the inverting input to AC ground set the frequency of the pole.